150mA
0
-150mA
500ms
500ms
PULSE
GENERATOR
VDD
DUT
INPUT OR
OUTPUT
GND
CURRENT
METER
POWER
SUPPLY
Figure 43. Latchup Test
LATCHUP TEST CONFIGURATION
Figure 43 shows the latchup test. VDD holds at +5.5 VDC, and
VSS holds at ground. The device test is at 125°C. Each type of
I/O alternately receives a positive and then negative 150 mA
pulse of 500 ms duration. The current is monitored after the
pulse for latchup condition. To prevent burnout, the supply
current is limited to 400 mA.
The UT1750AR has latchup immunity in excess of +150 mA
for 500 ms.
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