SFH 214
SFH 214 FA
Kennwerte (TA = 25 °C)
Characteristics (cont’d)
Bezeichnung
Description
Halbwinkel
Half angle
Dunkelstrom, VR = 20 V
Dark current
Spektrale Fotoempfindlichkeit, λ = 850 nm
Spectral sensitivity
Quantenausbeute, λ = 850 nm
Quantum yield
Leerlaufspannung
Open-circuit voltage
Ev = 1000 Ix, Normlicht/standard light A,
T = 2856 K
Ee = 0.5 mW/cm2, λ = 870 nm
Kurzschlußstrom
Short-circuit current
Ev = 1000 Ix, Normlicht/standard light A,
T = 2856 K
Ee = 0.5 mW/cm2, λ = 870 nm
Anstiegs- und Abfallzeit des Fotostromes
Rise and fall time of the photocurrent
RL = 50 Ω; VR = 20 V; λ = 850 nm; Ip = 800 µA
Durchlaßspannung, IF = 80 mA, E = 0
Forward voltage
Kapazität, VR = 0 V, f = 1 MHz, E = 0
Capacitance
Temperaturkoeffizient von VO
Temperature coefficient of VO
Temperaturkoeffizient von ISC
Temperature coefficient of ISC
Normlicht/standard light A
λ = 870 nm
Rauschäquivalente Strahlungsleistung
Noise equivalent power
VR = 10 V, λ = 850 nm
Nachweisgrenze, VR = 20 V, λ = 850 nm
Detection limit
Symbol
Symbol
Wert
Value
Einheit
Unit
SFH 214 SFH 214 FA
ϕ
± 40
± 40
Grad
deg.
IR
1 (≤ 5)
1 (≤ 5)
nA
Sλ
0.62
0.59
A/W
η
0.89
0.86
Electrons
Photon
VO
380 (≥ 300) –
mV
VO
–
340 (≥ 290) mV
ISC
42
–
µA
ISC
–
12
µA
tr, tf
5
5
ns
VF
C0
TCV
TCI
NEP
D*
1.3
1.3
V
11
11
pF
– 2.6
– 2.6
mV/K
%/K
0.18
–
–
0.2
2.9 × 10– 14 2.9 × 10– 14 W
√Hz
3.5 × 1012 3.5 × 1012
cm · √Hz
W
Semiconductor Group
3