25C080/160
TABLE 1-3: AC CHARACTERISTICS
Applicable over recommended operating ranges shown below unless otherwise noted.
VCC = 4.5V to 5.5V
Commercial (C): Tamb = 0° to +70°C
Industrial (I): Tamb = -40° to +85°C
Automotive (E): Tamb = -40˚C to +125˚C
Symbol
Parameter
Min
Max
Units
Test Conditions
fSCK
Clock Frequency
—
3
MHz
tCSS
CS Setup Time
100
—
ns
tCSH
CS Hold Time
100
—
ns
tCSD
CS Disable Time
250
—
ns
tSU
Data Setup Time
30
—
ns
tHD
Data Hold Time
50
—
ns
tR
CLK Rise Time
—
2
µs
(Note 1)
tF
CLK Fall Time
—
2
µs
(Note 1)
tHI
Clock High Time
150
—
ns
tLO
Clock Low Time
150
—
ns
tCLD
Clock Delay Time
50
—
ns
tV
Output Valid from
Clock Low
—
150
ns
tHO
Output Hold Time
0
—
ns
tDIS
Output Disable Time
—
200
ns
(Note 1)
tHS
HOLD Setup Time
100
—
ns
tHH
HOLD Hold Time
100
—
ns
tHZ
HOLD Low to Output High-Z
100
—
ns
(Note 1)
tHV
HOLD High to Output Valid
100
—
ns
(Note 1)
tWC
Internal Write Cycle Time
—
5
ms
(Note 2)
—
Endurance
10M
— E/W Cycles 25°C, Vcc = 5.0V, Block Mode
(Note 3)
Note 1: This parameter is periodically sampled and not 100% tested.
2: tWC begins on the rising edge of CS after a valid write sequence and ends when the internal self-timed write
cycle is complete.
3: This parameter is not tested but guaranteed by characterization. For endurance estimates in a specific appli-
cation, please consult the Total Endurance Model which can be obtained on our BBS or website.
DS21147F-page 4
Preliminary
© 1996 Microchip Technology Inc.